EXIDA SAFETY EQUIPMENT RELIABILITY HANDBOOK PDF

SIL Safe Data is a web site listing a number of product categories used in process control and the expected range of failure rates for process industry applications. The use of realistic and application appropriate failure rate data has a significant impact on the validity of SIL verification calculations. Unfortunately there is often conflicting or incomplete information readily available to perform this task. Determining if data is suitable for use is a critical first step. These bounds were derived from statistical analysis of FMEDA results which represent design variations and application variations in combination with extensive comparisons with realistic field failure data. The upper bound and lower bound dangerous failure rate data in SILSafeData is presented to perform quick comparisons with any piece of data.

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Open topic with navigation. Protective Instrument Loop Logic Solver records store details about logic solvers for a protective instrument loop. This topic provides an alphabetical list and description of the fields that exist for the Protective Instrument Loop Logic Solver family and appear on the Protective Instrument Loop Logic Solver datasheet.

The information in this table reflects the baseline state and behavior of these fields. This list is not comprehensive. This family is enabled for site filtering, which means that records in this family can be assigned to a specific site, and will then only be accessible to users who are assigned to the same site and have the appropriate license and family privileges.

See the Site Filtering section of the documentation for more information on using this feature. Approved Custom Device. Indicates whether the logic solver that is identified in the Exida Name field is approved for use in the protective instrument loop. If the Manual Entry check box is cleared, this value is disabled and populated with one of the following values based on the device identified in the Exida Name field:.

If the value in the Voting field is 1oo1 or D , this value is not applicable. This value is populated automatically when you select a device. When the Manual Entry check box is cleared, this value is disabled and populated with the date on which the reference data was published for the device that is identified in the Exida Name field.

When the Manual Entry check box is cleared, this field is disabled and populated with the data reference for the device that is identified in the Exida Name field. When the Manual Entry check box is cleared, this field is disabled and populated with the data revision for the device identified in the Exida Name field.

When the Manual Entry check box is cleared, this field is disabled and populated with the data source for the device identified in the Exida Name field. All rights reserved. Indicates whether application diagnostic testing is considered for the logic solver. This field is disabled and selected if the logic solver has been approved to use via the Validation Failure Rate Reference Data feature.

Architectural Type. Indicates whether the device is a simplex or a complex device. If the Manual Entry check box is cleared, this value is disabled and populated with one of the following values based on the device identified in the Exida Name field: A simplex device B complex device If the Manual Entry check box is selected, this field is enabled.

Automatic Channel Count. Automatic Prooftest Switchover. Indicates whether the logic solver performs proof tests automatically.

If you select this check box, the logic solver performs proof tests automatically. Automatic Prooftest Switchover Interval. A numeric value representing the frequency at which proof tests are performed by the logic solver. A number representing the percentage of time between proof tests that the logic solver is expected to be available.

Calculated PFD Avg. A number representing the probability that the logic solver will fail to react during a demand when the loop is operating in a low demand mode. This field is disabled. This value depends on the failure rate of the logic solver. Calculated PFH. A number representing the probability that the logic solver will fail to react during a demand when the loop is operating in high demand or continuous mode of operation.

Calculated STR. Common Cause Beta. A number representing the percentage of failure that would affect the functioning of multiple devices. For example, a power supply failure for a logic solver that is shared across multiple loops can cause all the loops to fail.

In this case, the beta factor is the probability that the loops fail in case of a power supply failure to the logic solver. Device Name. Indicates whether the application diagnostic test is automatic or manual. You can select one of the following values: Automatic Manual. The percentage of failures that could be detected as part of automatic diagnostic test coverage. The units for the application diagnostic test interval that you have specified in the Diagnostic Test Interval field.

You can select one of the following values: Months Days. This field contains a button, which you can select to search for the desired Equipment. You can link only one Equipment. Functional Location. This field contains a button, which you can select to search for the desired Functional Location. You can link to only one Functional Location. A number representing the hardware fault tolerance, or the number of failures the logic solver can tolerate before failing.

For example, a logic solver with 1oo2 redundancy has a HFT of 1 because it can tolerate one failure and can still continue to operate. Logic Solver ID. This value is required and is populated with a default value. You can, however, provide a different value. This value must be unique. Manual Entry. Once you select this check box, you cannot clear it. For example, suppose a logic solver senses a hazard that does not exist.

This value is measured in years. A number representing Mean Time To Repair, or the time it takes to repair the logic solver after a failure is detected. This value is measured in hours.

The value that you enter must be between 4 and Otherwise, an error message will appear. This value is required. Proof Test Coverage. A number representing the percentage of failures that are detected by the proof test i. The number that you enter must be between 0 and Proof Test Interval.

A number representing the monthly intervals at which the proof test should be performed. The number that you enter must be between 1 and , or an error message will appear. Reference Data Date. The date on which that the reference data was published for the device that is identified in the Exida Name field.

This field displays the Calendar feature. When the Manual Entry check box is selected, this field is enabled. Reference Data Reference. The specific failure data reference as it appears in the Exida data source that is identified in the Reference Data Source field. When the Manual Entry check box is selected, this value is enabled.

Reference Data Revision. A number that represents the number of times the reference data has been revised in the Exida database. Reference Data Source. SIL Architectural Constraints. A number that represents the SIL value for the logic solver, which is based on the architectural constraints that are defined in the Test Architecture Constraints field.

SIL Systematic Capability. A number that represents the SIL value for the logic solver which is based on the systematic capabilities that are defined in the failure rate data. This field is enabled or disabled based on the following criteria: When the Manual Entry check box is selected, the SIL Sytematic Capabilities field is enabled. This list contains the following options: 1oo1 1oo1D 1oo2 1oo2D 1oo3 2oo3 3oo3 This value is populated automatically when you select a device.

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